Atomic Force Microscope as a tool for nanomanipulation
نویسندگان
چکیده
An atomic force microscope (AFM) based system has been built for the manipulation of materials at the nanometer scale. The AFM is combined with an inverse optical microscope and an UV-laser microbeam system for photoablation. The actuators of the AFM are controlled using a digital signal processor. Real-time routines and a graphical user interface have been programmed for high resolution imaging and nanomanipulation. The nanomanipulation can be pre-programmed offline or directly performed using a low-cost haptic interface.
منابع مشابه
A versatile atomic force microscope for three-dimensional nanomanipulation and nanoassembly.
A conventional atomic force microscope (AFM) has been successfully applied to manipulating nanoparticles (zero-dimensional), nanowires (one-dimensional) or nanotubes (one- or two-dimensional) by widely used pushing or pulling operations on a single surface. However, pick-and-place nanomanipulation in air is still a challenge. In this research, a modified AFM, called a three-dimensional (3D) man...
متن کاملTeleoperated and Automatic Nanomanipulation Systems using Atomic Force Microscope Probes
Nanomanipulation as a new emerging area enables to change, interact and control the nanoscale phenomenon precisely. In this paper, teleoperated and automatic control strategies for Atomic Force Microscope (AFM) probe based nanomanipulation applications are introduced. Teleoperated touching to silicon surfaces at the nanoscale is realized using a scaled bilateral force-reflecting servo type tele...
متن کاملParallel imaging/manipulation force microscopy
Conventional atomic force microscope nanomanipulation is inefficient because of the serial imaging/manipulation operation. We present here a parallel imaging/manipulation force microscope PIMM to improve manipulation efficiency. The PIMM is equipped with two individually actuated cantilevers with protrudent tips. One cantilever acts as an imaging sensor by scanning nano-objects and tip of the o...
متن کاملReal-time State Estimation and Fault Detection for Controlling Atomic Force Microscope Based Nano Manipualtion ⋆
The main problem of Atomic Force Microscope (AFM) based nanomanipulation is the lack of real-time visual feedback. Although the model based visual feedback can partly solve this problem, the incorrect display caused by the uncertainties in the nano-environment often leads to a failed nanomanipulation. In this paper, a general strategy with three-level structure is proposed to overcome this prob...
متن کاملCellular level nanomanipulation using atomic force microscope aided with superresolution imaging.
Atomic force microscopes (AFM) provide topographical and mechanical information of the sample with very good axial resolution, but are limited in terms of chemical specificity and operation time-scale. An optical microscope coupled to an AFM can recognize and target an area of interest using specific identification markers like fluorescence tags. A high resolution fluorescence microscope can vi...
متن کامل